Advantest Announces T5501 Memory Test System

Advantest Announces T5501 Memory Test System

New High-Speed, High-Accuracy System Is Industry's Fastest for Testing Next-Generation High-Speed Memory

TOKYO, Dec. 2 /PRNewswire-FirstCall/ -- Advantest Corporation (NYSE:ATE), the global leader in semiconductor test systems, today introduced its T5501 memory test system. Capable of consistently testing high-speed memories at rapid speeds with exceptional accuracy, the T5501 is the semiconductor industry's fastest memory-test system. The new tester is on display this week at SEMICON Japan, December 1-3, at Chiba's Makuhari Messe.

The race to achieve higher device speeds and multiple functionality is rapidly advancing in high-performance PCs as the demand for lifelike graphics with audiovisual equipment, including digital TVs and game consoles, continues to escalate. Meanwhile, signifying an even faster Internet environment, new routers now offer terabit-level throughput. Consequently, these and other machines are driving a shift toward increased employment of very high-speed memory devices, including SRAM, DDR3-SDRAM and GDDR3/4-SDRAM.

Advantest's new T5501 memory test system is specifically designed to test these devices, whose transmission speeds (in DDR mode) surpass 1GHz to offer a maximum test speed of 2.133GHz (in DDR mode) with uncompromised accuracy. To achieve the transfer of high volumes of data at high speeds, the T5501 utilizes a newly developed fiber-optic transmission technology that reduces the cable length between the mainframe and the test head to one-twelfth the length of cable previously required. This holds down the size of the unit while giving the T5501 a board-signal density 3.2 times greater than the industry standard.

Supporting a source synchronous method that speeds up memory bus, as well as a multiple-strobe function that measures the phase difference between device outputs and reference clock signals at each clock cycle, the T5501 can measure the relative phase in relation to data spread of individual devices, while testing up to 32 devices in parallel. This high throughput, together with its high accuracy, makes the T5501 ideal for use on production lines. The system also features high clock linearity (+/- 7ps) and a timing-signal generator that enables resolution of timing signals at 1.83ps, allowing it to achieve the accuracy that device development and evaluation demand.

The T5501 retains software environment compatibility with its predecessor system, the T55XX series, and can therefore be used with existing customer assets, including test programs. The labor involved in the upgrade process is minimal.

Main Specifications
Target Devices: GDDR3/4-SDRAM, SRAM, DDR3-SDRAM
Parallel Testing: Up to 32 devices per system
Max Test Speed: 1.066GHz / 2.133GHz (in DDR mode)

About Advantest


Advantest Corporation is the world's leading automatic test equipment supplier to the semiconductor industry, and also produces electronic and optoelectronic instruments and systems. A global company, Advantest has long offered total ATE solutions, and serves the industry in every component of semiconductor test: tester, handler, mechanical and electrical interfaces, and software. Its SoC, logic, memory, mixed-signal and RF testers and device handlers are integrated into the most advanced semiconductor fabrication lines in the world. Founded in Tokyo in 1954, Advantest established its North American subsidiary in 1982. Advantest America, Inc. and Advantest America R&D Center, Inc. are based in Santa Clara, Calif. More information is available at www.advantest.com.


Source: Advantest Corporation

CONTACT: Amy Gold of Advantest America, Inc., +1-212-753-0007, or
a.gold@advantest.com; or Lisa Gillette-Martin of MCA, +1-650-968-8900, or
lgmartin@mcapr.com, for Advantest Corporation

Web site: http://www.advantest.com/


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